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Data pattern dependence of VCSEL far-field distributions

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dc.contributor.authorLear, Kevin L., author
dc.contributor.authorAl-Sowayan, S., author
dc.contributor.authorIEEE, publisher
dc.date.accessioned2007-01-03T04:42:37Z
dc.date.available2007-01-03T04:42:37Z
dc.date.issued2004
dc.description.abstractThe far field divergence angle distribution of vertical-cavity surface-emitting lasers is found to exhibit dependence on the data pattern driving the lasers. Two 50% duty cycle 1.25-Gb/s data patterns chosen to cause the same thermal conditions but with frequency content differing by a factor of 16 resulted in changes in the beam profile distributions with up to a 30% power variation in the central on-axis portion of the beam. Examination of the temporal waveforms as a function of far field angle revealed overshoot in the on-axis power and undershoot in the off-axis portion of the beam.
dc.format.mediumborn digital
dc.format.mediumarticles
dc.identifier.bibliographicCitationAl-Sowayan, S. and K. L. Lear, Data Pattern Dependence of VCSEL Far-Field Distributions, IEEE Photonics Technology Letters 16, no. 10 (October 2004): 2215-2217.
dc.identifier.urihttp://hdl.handle.net/10217/820
dc.languageEnglish
dc.language.isoeng
dc.publisherColorado State University. Libraries
dc.relation.ispartofFaculty Publications
dc.rights©2004 IEEE.
dc.rightsCopyright and other restrictions may apply. User is responsible for compliance with all applicable laws. For information about copyright law, please see https://libguides.colostate.edu/copyright.
dc.subjectfar field
dc.subjectdata pattern dependent
dc.subjectbeam divergence
dc.subjectlaser diode
dc.subjectmultimode fiber optic
dc.titleData pattern dependence of VCSEL far-field distributions
dc.typeText

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