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Soft-x-ray interferometer for single-shot laser linewidth measurements

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dc.contributor.authorChilla, Juan L. A., author
dc.contributor.authorMartinez, Oscar E., author
dc.contributor.authorRocca, Jorge J., author
dc.contributor.authorMarconi, Mario C., author
dc.contributor.authorOptical Society of America, publisher
dc.date.accessioned2007-01-03T08:10:06Z
dc.date.available2007-01-03T08:10:06Z
dc.date.issued1996
dc.description.abstractA soft-x-ray Mach-Zehnder interferometer configuration that makes use of the time delay introduced by diffraction gratings to conduct single-shot measurements of the linewidth of soft-x-ray laser amplifiers is proposed and analyzed. The scheme was experimentally demonstrated in the near-IR region of the spectrum by measurement of the mode separation of a semiconductor laser. A symmetric configuration with compensated time delays that can be implemented for plasma diagnostics and for evaluating soft-x-ray optics is also discussed.
dc.format.mediumborn digital
dc.format.mediumarticles
dc.identifier.bibliographicCitationChilla, Juan L. A., et al., Soft-X-Ray Interferometer for Single-Shot Laser Linewidth Measurements, Optics Letters 21, no. 13 (July 1, 1996): 955-957.
dc.identifier.urihttp://hdl.handle.net/10217/67588
dc.languageEnglish
dc.language.isoeng
dc.publisherColorado State University. Libraries
dc.relation.ispartofFaculty Publications
dc.rights©1996 Optical Society of America.
dc.rightsCopyright and other restrictions may apply. User is responsible for compliance with all applicable laws. For information about copyright law, please see https://libguides.colostate.edu/copyright.
dc.titleSoft-x-ray interferometer for single-shot laser linewidth measurements
dc.typeText

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