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Dc track edge interactions

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dc.contributor.authorMuller, M. W., author
dc.contributor.authorHoinville, J. R., author
dc.contributor.authorReising, Steven C., author
dc.contributor.authorIndeck, Ronald Scott, author
dc.contributor.authorAmerican Institute of Physics, publisher
dc.date.accessioned2007-01-03T07:28:55Z
dc.date.available2007-01-03T07:28:55Z
dc.date.issued1991
dc.description.abstractWe have developed an experimental method for investigating the interaction between two dc track edges by studying the track edge noise. We conclude that two edges do not interact when they are several micrometers apart, but the noise reduces nearly to zero when their separation is less than about half a micrometer. There is a transition region that exists between these two limits. The net track edge noise power from two dc edges is quantized, implying that in our experiment track edges interact around the complete revolution of the disk or not at all.
dc.description.sponsorshipThis work was supported in part by NSF Grant No. ECS-880470 and NSF Presidential Young Investigator Award (Indeck) ECS-89-5714.
dc.format.mediumborn digital
dc.format.mediumarticles
dc.identifier.bibliographicCitationIndeck, R. S., et al., Dc Track Edge Interactions, Journal of Applied Physics 69, no. 8 (15 April 1991): 4721-4723.
dc.identifier.urihttp://hdl.handle.net/10217/679
dc.languageEnglish
dc.language.isoeng
dc.publisherColorado State University. Libraries
dc.relation.ispartofFaculty Publications
dc.rights©1991 American Institute of Physics.
dc.rightsCopyright and other restrictions may apply. User is responsible for compliance with all applicable laws. For information about copyright law, please see https://libguides.colostate.edu/copyright.
dc.subjectnoise
dc.subjectthin films
dc.subjectmagnetic storage devices
dc.subjectmicrostructure
dc.subjectmagnetic properties
dc.titleDc track edge interactions
dc.typeText

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