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Differential carrier lifetime in oxide-confined vertical cavity lasers obtained from electrical impedance measurements

dc.contributor.authorLear, Kevin L., author
dc.contributor.authorTemkin, H., author
dc.contributor.authorKuksenkov, D. V., author
dc.contributor.authorGiudice, G. E., author
dc.contributor.authorAmerican Institute of Physics, publisher
dc.date.accessioned2007-01-03T04:41:14Z
dc.date.available2007-01-03T04:41:14Z
dc.date.issued1999
dc.description.abstractDifferential carrier lifetime measurements were performed on index-guided oxide-confined vertical cavity surface emitting lasers operating at 980 nm. Lifetimes were extracted from laser impedance measurements at subthreshold currents, with device size as a parameter, using a simple small-signal model. The carrier lifetimes ranged from 21 ns at 9 µA, to about 1 ns at a bias close to threshold. For a 6 × 6 µm2 oxide aperture device the threshold carrier density was nth ~ 2 × 1018cm-3. The effect of carrier diffusion was also considered. An ambipolar diffusion coefficient of D ~ 11 cm2s-1 was obtained.
dc.description.sponsorshipWork at Texas Tech is supported by BMDO (monitored by Lou Lome), DARPA, and the J. F. Maddox Foundation.
dc.format.mediumborn digital
dc.format.mediumarticles
dc.identifier.bibliographicCitationGiudice, G. E., et al., Differential Carrier Lifetime in Oxide-Confined Vertical Cavity Lasers Obtained from Electrical Impedance Measurements, Applied Physics Letters 74, no. 7 (15 February 1999): 899-901.
dc.identifier.urihttp://hdl.handle.net/10217/818
dc.languageEnglish
dc.language.isoeng
dc.publisherColorado State University. Libraries
dc.relation.ispartofFaculty Publications
dc.rights©1999 American Institute of Physics.
dc.rightsCopyright and other restrictions may apply. User is responsible for compliance with all applicable laws. For information about copyright law, please see https://libguides.colostate.edu/copyright.
dc.subjectcarrier lifetime
dc.subjectsurface emitting lasers
dc.subjectcarrier density
dc.subjectcarrier mobility
dc.titleDifferential carrier lifetime in oxide-confined vertical cavity lasers obtained from electrical impedance measurements
dc.typeText

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