Novel methods to quantify aleatory and epistemic uncertainty in high speed networks
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With the sustained miniaturization of integrated circuits to sub-45 nm regime and the increasing packaging density, random process variations have been found to result in unpredictability in circuit performance. In existing literature, this unpredictability has been modeled by creating polynomial expansions of random variables. But the existing methods prove inefficient because as the number of random variables within a system increase, the time and computational cost increases in a near-polynomial fashion. In order to mitigate this poor scalability of conventional approaches, several techniques ...