Developing and applying the scanning probe microscopy technique for solar cell materials
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The study of electrical properties of solar cells at the nanometer (nm) scale has benefited greatly from characterization techniques using scanning probe microscopy (SPM), a unique and powerful tool. These characterization techniques help scientists understand the fundamental physics of materials properties and device operation and provide vital information in photovoltaic research. This work focuses on developing and applying SPM, which includes atomic force microscopy (AFM) and scanning electron microscopy (SEM)-based characterizations, to solar cell materials and devices. We include extensive ...