NOVEL INSTRUMENTATION FOR THE CHARACTERIZATION OF ELECTRONIC AND PHYSICAL RESPONSES OF LIQUID CRYSTAL BASED DEVICES OPERATING IN THE MICROWAVE REGION
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ABSTRACT Two novel instrumentation assemblies were designed and constructed to facilitate the testing of liquid crystal based devices in the microwave region. The first test assembly was designed to allow the use of a vector network analyzer to measure and record the S parameters and phase data. The test assembly uses a sixth order Bessel filter arrangement to protect the vector network analyzer from potential damage during measurements. The second assembly allows the application of AC bias signal voltages and frequencies beyond the ratings of the vector network analyzers. This new test setup ...