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Soft-x-ray interferometer for single-shot laser linewidth measurements

Date

1996

Authors

Chilla, Juan L. A., author
Martinez, Oscar E., author
Rocca, Jorge J., author
Marconi, Mario C., author
Optical Society of America, publisher

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Abstract

A soft-x-ray Mach-Zehnder interferometer configuration that makes use of the time delay introduced by diffraction gratings to conduct single-shot measurements of the linewidth of soft-x-ray laser amplifiers is proposed and analyzed. The scheme was experimentally demonstrated in the near-IR region of the spectrum by measurement of the mode separation of a semiconductor laser. A symmetric configuration with compensated time delays that can be implemented for plasma diagnostics and for evaluating soft-x-ray optics is also discussed.

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